Journal Title：Microelectronics Reliability

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

《微電子可靠性》致力于傳播微電子設備、電路和系統可靠性的最新研究成果和相關信息，涵蓋材料、工藝和制造、設計、測試和操作等各個方面。該期刊涵蓋以下主題：測量、理解和分析；評估和預測；建模和仿真；方法和緩解。將可靠性與微電子工程其他重要領域（如設計、制造、集成、測試和現場操作）相結合的論文也將受到歡迎，并且特別鼓勵報告該領域和特定應用領域案例研究的實踐論文。

大多數被接受的論文將以研究論文的形式發表，描述重大進展和已完成的工作?；仡櫰毡楦信d趣的重要發展主題的論文可能會被接受作為評論論文發表。更初步的緊急通訊和關于當前感興趣的已完成實踐工作的簡短報告可能會被考慮作為研究筆記發表。所有投稿均需經過該領域頂尖專家的同行評審。

Microelectronics Reliability創刊于1964年，由Elsevier Ltd出版商出版，收稿方向涵蓋工程技術 - 工程：電子與電氣全領域，此期刊水平偏中等偏靠后，在所屬細分領域中專業影響力一般，過審相對較易，如果您文章質量佳，選擇此期刊，發表機率較高。平均審稿速度 較快,2-4周 約8.3周，影響因子指數1.6，該期刊近期沒有被列入國際期刊預警名單，廣大學者值得一試。