Journal Title：Ieee Design & Test

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《IEEE 設計與測試》提供原創作品，介紹用于設計和測試微電子系統（從設備和電路到完整的片上系統和嵌入式軟件）的模型、方法和工具。該雜志側重于當前和近期的實踐，包括教程、操作方法文章和真實案例研究。該雜志力求通過專欄、訪談和圓桌討論，向讀者介紹重要的技術進步以及技術領導者的觀點。主題包括半導體 IC 設計、半導體知識產權模塊、設計、驗證和測試技術、制造和產量設計、嵌入式軟件和系統、低功耗和節能設計、電子設計自動化工具、實用技術和標準。

Ieee Design & Test創刊于2013年，由IEEE Computer Society出版商出版，收稿方向涵蓋COMPUTER SCIENCE, HARDWARE & ARCHITECTURE - ENGINEERING, ELECTRICAL & ELECTRONIC全領域，此期刊水平偏中等偏靠后，在所屬細分領域中專業影響力一般，過審相對較易，如果您文章質量佳，選擇此期刊，發表機率較高。平均審稿速度 ，影響因子指數1.9，該期刊近期沒有被列入國際期刊預警名單，廣大學者值得一試。